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A O(t3+|E|) fault identification algorithm for diagnosable systems

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1 Author(s)
Sullivan, G.F. ; Dept. of Comput. Sci., Johns Hopkins Univ., Baltimore, MD, USA

Systems composed of many processing units can use these units to help perform self-diagnosis. An algorithm is presented that performs this type of diagnosis for the system-level fault model. The time complexity of the algorithm is O(t3+|E|), where |E| is the number of tests and t is the number of allowed faults. When t is small relative to the total number of system components n, this is the tightest known time bound; when t is O(n5/6) this is the best bound

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Computers, IEEE Transactions on  (Volume:37 ,  Issue: 4 )