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SPICE simulation of latch-up anomalous effects observed by electrical measurements and IR microscopy

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5 Author(s)
F. Corsi ; Dipartimento di Elettrotecnica ed Elettronica, Bari Univ., Italy ; S. Martino ; M. Muschitiello ; M. Stucchi
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Pulsed overvoltage tests have identified anomalies in the electrical characteristics of latch-up in CMOS ICs and 'window' effects, while infra-red (IR) microscopy revealed that latch-up current switching is due to competition between different latch-up paths. The SPICE simulation of a simple, lumped, equivalent circuit model, comprising two or more parasitic structures, allows anomalous effects to be produced and helps in the understanding of latch-up triggering mechanisms. Parasitic bipolar transistors connected to the I/O structure, not involved in latch-up in steady-state, are shown to play a major role in latch-up triggering and in causing anomalous effects.<>

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IEE Proceedings G - Circuits, Devices and Systems  (Volume:136 ,  Issue: 6 )