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Exhaustive test pattern generation using cyclic codes

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1 Author(s)
Chen, C.L. ; IBM, Poughkeepsie, NY, USA

The generation of exhaustive test patterns for VLSI circuits using linear feedback shift registers is described in terms of cyclic codes. Punctured cyclic codes are used to generate exhaustive test patterns of any length. A techniques for the generation of punctured cyclic codes is presented. A technique is also presented to reduce the size of test sets obtained from punctured cyclic codes

Published in:

Computers, IEEE Transactions on  (Volume:37 ,  Issue: 2 )