By Topic

Concurrent error detection and correction in real-time systolic sorting arrays

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Sy-Yen Kuo ; Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan ; Sheng-Chiech Liang

A novel approach to online error detection and correction for high-throughput VLSI sorting arrays is presented. The error model is defined at the sorting element level and both functional errors and data errors are considered. Functional errors are detected and corrected by exploiting inherent properties as well as newly discovered special properties of the sorting array. Coding techniques are used to locate data errors. All the checkers are designed to be totally self-checking and hence the sorting array is highly reliable. Two-level pipelining is employed, making the design very efficient and suitable for real-time application. The structure is very regular and therefore is very attractive for VLSI or WSI implementation

Published in:

IEEE Transactions on Computers  (Volume:41 ,  Issue: 12 )