Cart (Loading....) | Create Account
Close category search window

Retrials and balks (queueing)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Gilbert, E. ; AT&T Bell Lab., Murray Hill, NJ, USA

An overloaded service system may reject customers if it has no queue to store them. In practice, rejected customers return later to make retrials and may not leave permanently (balk) until several retrials fail. A single-server system with Poisson arrivals is examined in which rejected customers balk or make retrials according to a simple probabilistic model. Customer service times are independent random variables, all with the same given distribution function b(t). The stationary probability distribution for the number of customers waiting to make retrials satisfies a complicated functional equation. The solution is elusive in general but can be obtained for special b(t) (exponential distribution) or special values of model parameters. When the solution cannot be found, bounds on the fraction of customers served can be obtained

Published in:

Information Theory, IEEE Transactions on  (Volume:34 ,  Issue: 6 )

Date of Publication:

Nov 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.