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Test algorithms for double-buffered random access and pointer-addressed memories

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3 Author(s)

Test algorithms for static double-buffered RAMs and pointer-addressed memories (PAMs) are presented. The reasons why test algorithms for single-buffered memories are inadequate to test double-buffered memories (DBMs) are discussed. To obtain a realistic fault model, the authors perform an inductive fault analysis on the DBM cells. They also show that the address generation method imposes different requirements on the test algorithms.<>

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Design & Test of Computers, IEEE  (Volume:10 ,  Issue: 2 )