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Built-in self-diagnosis for repairable embedded RAMs

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2 Author(s)
Treuer, R. ; Dept. of Electr. Eng., McGill Univ., Montreal, Que., Canada ; Agarwal, V.K.

A method of built-in self-diagnosis (BISD) for repairable, embedded static RAMs (SRAMs) is presented. The BISD circuit, with self-repair, requires about 5% extra area in a 64-kb SRAM. The circuit contains a small reduced-instruction-set processor, which executes diagnosis algorithms stored in a ROM. These algorithms employ hybrid serial/parallel operations when external repair is available or modular operations when self-repair is required. The algorithms, hardware design, and design costs and tradeoffs are discussed.<>

Published in:

Design & Test of Computers, IEEE  (Volume:10 ,  Issue: 2 )

Date of Publication:

June 1993

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