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Eddy current losses at cryogenic temperatures

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3 Author(s)
V. Sokolovsky ; Dept. of Electr. & Comput. Eng., Ben-Gurion Univ. of the Negev, Beer-Sheva, Israel ; V. Meerovich ; M. Slonim

The effect of thermal processes on eddy-current losses in the structural elements of cryogenic and superconducting devices are analyzed. Maxwell's equations coupled with the heat-conduction equation are solved, taking into account the dependence of resistivity, heat capacity, and heat-transfer coefficient on temperature. Losses are analyzed as a function of magnetic field, frequency, and geometry for a thin strip in a uniform magnetic field. It is shown that losses calculated taking the thermal processes into account may differ from those obtained at constant temperature

Published in:

IEEE Transactions on Magnetics  (Volume:29 ,  Issue: 3 )