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Testing of mixed-signal systems using dynamic stimuli

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3 Author(s)
Taylor, D. ; Huddersfield Univ., UK ; Evans, P.S.A. ; Pritchard, T.I.

The impulse response of a linear circuit element contains enough information to functionally characterise that element. A technique for comparison of observed and expected (reference) transient responses, which results in an absolute measure of device functionality, is presented. Comparisons of transient response test results with the results from existing test programs are also presented.

Published in:

Electronics Letters  (Volume:29 ,  Issue: 9 )