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Automated diagnosis of VLSI failures

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3 Author(s)
Ryan, P.G. ; Intel Corp., Folsom, CA, USA ; Rawat, S. ; Fuchs, W.K.

Fault dictionaries are examined as a tool for automated diagnosis of VLSI failures. A compressed fault dictionary format and diagnosis algorithms are presented. Both combinational and sequential circuits are considered. Dictionaries are created, for example ISCAS circuits and simulated errors diagnosed.<>

Published in:

VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers

Date of Conference:

15-17 April 1991