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Use of CrossCheck test technology in practical applications

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4 Author(s)
S. Chandra ; CrossCheck Technol. Inc., San Jose, CA, USA ; T. Gheewala ; H. Sucar ; G. Swan

The CrossCheck technique is beginning to gain acceptance as an effective low-cost solution to the ASIC testability problem. The technique provides massive observability by embedding test circuitry into the ASIC device. This allows highly accurate defect modeling and simulation with less computational resources than conventional techniques. This paper describes CrossCheck test technology and present results on its application to real-life designs. All these designs are sequential in nature with multiple, gated and asynchronous clocks. Bridging, comprehensive (opens and shorts) as well as conventional stuck-at I/O fault coverage, and CPU time and memory requirements are presented.<>

Published in:

VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers

Date of Conference:

15-17 April 1991