Referenced Items are not available for this document.
This paper describes a design-for-testability expert system for the selection of the most appropriate test method for every macro within an IC. The interface with the system designer is user-friendly and together with an efficient search mechanism this expert system can be used as a framework for all types of macros. This tool will be used in a self-test compiler, which generates the layout of self-testable macros automatically. The self-test compiler can be part of a silicon compilation system and thus contribute to the integration of testability into the design process.<
Published in:
VLSI Test Symposium, 1991. 'Chip-to-System Test Concerns for the 90's', Digest of Papers
Date of Conference: 15-17 April 1991
- Page(s):
- 10 - 15
- Meeting Date :
- 15 Apr 1991-17 Apr 1991
- INSPEC Accession Number:
- 4024380
- Conference Location :
- Atlantic City, NJ, USA
- Digital Object Identifier :
- 10.1109/VTEST.1991.208125
- Product Type:
- Conference Publications
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