By Topic

Using scan technology for debug and diagnostics in a workstation environment

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Dervisoglu, B.I. ; Apollo Comput. Inc., Chelmsford, MA, USA

An architecture for implementing scan technology for test and debug in a state-of-the-art workstation is described. Architectural features include controlling the scan and clock functions from a single resource which can also perform linear-feedback shift-register-based pseudorandom testing and test-result compression by signature capture. Operations of the scan subsystem are controlled from a service processor which uses a diagnostics bus to communicate with individual scan and clock resource units present on each system board. For debug purposes the service processor has been linked with a remote computer and software has been developed to display and/or modify system state variables (flip-flops). Analysis of scan overhead indicate that benefits in test and debug of the target system far outweigh the cost of implementing scan technology for the APOLLO DN 10000 workstation

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988