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Automatic location of IC design errors using an E-beam system

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7 Author(s)

The ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed search

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988