Cart (Loading....) | Create Account
Close category search window

Contactors for testing at high frequencies

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Riechelmann, B. ; SYM-TEK Syst. Inc., San Diego, CA, USA

A review is presented of the contactor in testing of high-speed ICs. The contactor, which establishes temporary connections to the leads of the device under test (DUT), must not impair the electrical performance of the DUT. In addition, it must have mechanical and thermal characteristics suitable for automatic environmental handling. The author concludes that although the ideal or perfect test contactor does not yet exist, contactor design is keeping pace with advances in the integrated-circuit industry

Published in:

Test Conference, 1988. Proceedings. New Frontiers in Testing, International

Date of Conference:

12-14 Sep 1988

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.