Cart (Loading....) | Create Account
Close category search window
 

A novel concurrent error detection scheme for FFT networks

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Tao, D.L. ; Dept. of Electr. Eng., State Univ. of New York, Stony Brook, NY, USA ; Hartmann, C.R.P.

The algorithm-based fault tolerance techniques have been proposed to obtain reliable results at very low hardware overhead. Even though 100% fault coverage can be theoretically obtained by using these techniques, the system performance, i.e., fault coverage and throughput, can be drastically reduced due to many practical problems, e.g., round-off errors. A novel algorithm-based fault tolerance scheme is proposed for fast Fourier transform (FFT) networks. It is shown that the proposed scheme achieves 100% fault coverage theoretically. An accurate measure of the fault coverage for FFT networks is provided by taking the round-off error into account. The proposed scheme is shown to provide concurrent error detection capability to FFT networks with low hardware overhead, high throughput, and high fault coverage

Published in:

Parallel and Distributed Systems, IEEE Transactions on  (Volume:4 ,  Issue: 2 )

Date of Publication:

Feb 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.