Scheduled System Maintenance:
Some services will be unavailable Sunday, March 29th through Monday, March 30th. We apologize for the inconvenience.
By Topic

Learning visual models from shape contours using multiscale convex/concave structure matching

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Ueda, N. ; NTT Commun. Sci. Lab., Kyoto, Japan ; Suzuki, S.

A novel approach is proposed for learning a visual model from real shape samples of the same class. The approach can directly acquire a visual model by generalizing the multiscale convex/concave structure of a class of shapes, that is, the approach is based on the concept that shape generalization is shape simplification wherein perceptually relevant features are retained. The simplification does not mean the approximation of shapes but rather the extraction of the optimum scale convex/concave structure common to shape samples of the class. The common structure is obtained by applying the multiscale convex/concave structure-matching method to all shape pairs among given shape samples of the class and by integrating the matching results. The matching method, is applicable to heavily deformed shapes and is effectively implemented with dynamic programming techniques. The approach can acquire a visual model from a few samples without any a priori knowledge of the class. The obtained model is very useful for shape recognition. Results of applying the proposed method are presented

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:15 ,  Issue: 4 )