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Are components still the major problem: a review of electronic system and device field failure returns

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2 Author(s)
Pecht, M. ; CALCE Electron. Packaging Res. Center, Maryland Univ., College Park, MD, USA ; Ramappan, V.

A collection of electronic system and device (component) failure data from various sources over the last 20 years (1972-1992) is presented. Categories of failures are illustrated by means of pie charts. Issues of data collection and confusions in the definitions of failure mechanisms, failure sites, and stages of failure occurrence (design, manufacturing, testing) are discussed. The most recent data are then evaluated, the contribution of the inherent component failures to the system failures is analyzed, and conclusions of significance to the industry are discussed

Published in:

Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:15 ,  Issue: 6 )

Date of Publication:

Dec 1992

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