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Built-in self-test structure for mixed-mode circuits

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1 Author(s)
Wurtz, L.T. ; Dept. of Electr. Eng., Alabama Univ., Tuscaloosa, AL, USA

A built-in self-test (BIST) structure is presented which provides controllability and observability to analog circuits under test with significantly reduced hardware overhead compared to previously reported methods. The test structure is equally applicable to digital circuits, and lends itself to automated insertion into circuits under test

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:42 ,  Issue: 1 )