Cart (Loading....) | Create Account
Close category search window

A method for measurement of multiple light spot positions on one position-sensitive detector (PSD)

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Qian, D. ; Dept. of Mech. Eng., Texas Univ., Austin, TX ; Wang, W. ; Busch-Vishniac, I.J.

The measurement method described relies on using light sources, each of which is modulated at different frequencies and then demodulated in the sensor signal-processing circuit using a pulse amplitude modulation (PAM) scheme. The position of each light spot can be determined even if there are other beams irradiating the PSD at the same time. In a very simple experiment, the light beams from two LEDs were projected onto one PSD, with one LED modulated at 10 kHz and the other at 5 kHz. The PSD was calibrated by scanning the light beams across the PSD in equidistant grid lines over a 4-mm×7.2-mm area. It was found that the resolution, linearity, and accuracy of the measurement are not affected even if multiple light beams are continuously present. The number of light beams which can be used simultaneously is limited only by the bandwidth of the PSD and the sampling time of the sample/hold devices used in the DC restoration circuit

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:42 ,  Issue: 1 )

Date of Publication:

Feb 1993

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.