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PYFS-a statistical optimization method for integrated circuit yield enhancement

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2 Author(s)
S. W. Pan ; Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA ; Y. H. Hu

An efficient optimization method for the statistical design of integrated circuits is presented. This method, called the pseudo yield function substitution (PYFS) algorithm, is developed to help a designer select design parameters to maximize the product yield. The design goal of PYFS is to use fewer simulation runs to reach a yield-optimized design. This is accomplished with the development of an improved response surface method for accurate estimation of the circuit response function, and the use of a novel PYFS method for yield maximization

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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems  (Volume:12 ,  Issue: 2 )