Cart (Loading....) | Create Account
Close category search window
 

Steady-state and transient C-V response of a high-voltage nonlinear barium titanate ceramic-disc power-snubber capacitor

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

5 Author(s)
Campbell, C.K. ; Rand Afrikaans Univ., Johannesburg, South Africa ; van Wyk, J.D. ; Holm, M.F.K. ; Prinsloo, J.J.R.
more authors

Observations are reported on the steady-state and transient capacitance-voltage (C-V) response of barium titanate (BaTiO3) nonlinear ceramic-disk capacitors with breakdown voltages above 1500 V, fabricated for use in power electronic dissipative resistance-capacitance-diode (RCD) snubbers to reduce the stored-energy requirement. This includes the in situ C-V snubber performance in a 1000 V bipolar junction transistor switch test circuit. The considerable difference between the room-temperature C-V response in a conventional AC test bridge and that in a novel 1500 V quasi-DC charge/discharge hysteresis test circuit is explained in terms of an equivalent circuit model derived for such nonlinear ceramic-disk capacitors

Published in:

Electronic Components and Technology Conference, 1992. Proceedings., 42nd

Date of Conference:

18-20 May 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.