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Boundary scan with built-in self-test

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2 Author(s)
Gloster, C.S., Jr. ; Microelectron. Center of North Carolina, Research Triangle Park, NC, USA ; Brglez, F.

The authors propose a way to merge boundary scan with the built-in self-test (BIST) of printed circuit boards. Their boundary-scan structure is based on Version 2.0 of the Joint Task Action Group's recommendations for boundary scan and incorporates BIST using a register based on cellular automata (CA) techniques. They examine test patterns generated from this register and the more conventional linear-feedback shift register. The advantages of the CA register, or CAR, are its modularity, which allows modification without major redesign, its higher stuck-at fault coverage, and its higher transition fault coverage.<>

Published in:

Design & Test of Computers, IEEE  (Volume:6 ,  Issue: 1 )