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An ultra high speed test system

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1 Author(s)
Henley, F.J. ; Photon Dynamics Inc., San Jose, CA, USA

The test-head subsystem presented uses gallium arsenide pin electronics to provide nonrepeating zero data rates up to 1.2 Gb/s. The device under test is connected to laser-scanned optical sensors, and the test system receivers use an electrooptic measurement method to capture the pin information. The receiver has a 4.5-GHz bandwidth and can perform functional test at the emitter-coupled logic level with one sampling pulse per vector. The device environment supports signals bandwidths near 5 GHz.<>

Published in:

Design & Test of Computers, IEEE  (Volume:6 ,  Issue: 1 )