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250-MHz advanced test systems

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2 Author(s)
Gruodis, A.J. ; IBM Gen. Technol., Hopewell Junction, NY, USA ; Hoffman, D.E.

New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.<>

Published in:

Design & Test of Computers, IEEE  (Volume:5 ,  Issue: 2 )