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Real-world board test effectiveness

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1 Author(s)
Schlotzhauer, E.O. ; Hewlett-Packard, Loveland, CO, USA

In-circuit testing is commonly thought to be inefficient for a high level of quality control, and unable to match the high yields of functional testing. A quantitative study of 34,296 boards that represented the testing of 6,671,038 components reveals that in-circuit testing can produce high yields -96.9% in this case. The author looks at this study.<>

Published in:

Design & Test of Computers, IEEE  (Volume:5 ,  Issue: 2 )

Date of Publication:

April 1988

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