Cart (Loading....) | Create Account
Close category search window
 

On the detection and measurement of discontinuities

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Pawlak, M. ; Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada

Studies the detection and size measurement of discontinuities from sampled noisy data of an univariate function. The proposed tests and estimators are of the form of linear convolution filters with characteristics employing series expansions. In particular, the standard and conjugate Fourier series are taken into consideration. The convergence properties (consistency and rate of convergence) of the proposed estimates are established. The asymptotic results model the performance of the estimates on grids which become increasingly fine, i.e., when the signal resolution increases. Unlike other techniques in the literature, no specific form of the underlying function is assumed, and behavior of the function in the neighborhood of the discontinuity need not be in the form of a step function

Published in:

Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on

Date of Conference:

30 Aug-3 Sep 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.