Cart (Loading....) | Create Account
Close category search window
 

An estimator of edge length and surface area in digitized 2D and 3D images

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Verbeek, P.W. ; Fac. of Appl. Phys., Delft Univ. of Technol., Netherlands ; Van Vliet, L.J.

Existing estimators for edge length in 2D and surface area in 3D are applied to a binary representation of the object. The authors estimate length and area through volume measurements. Volume is measured without thresholding and does not introduce a sampling error. Edges are transformed into volumes by giving them a constant height after which they can be shifted perpendicular to the edge over a small distance. Subtraction of two images shifted in opposite direction produces a volume that is proportional to the edge length. To guarantee a constant edge height along the edge or across the surface to be measured the authors apply a `soft' clipping operation to the linear region of the edge. For accurate and isotropic displacement of edges the authors introduce a continuous space equivalent to the discrete local minimum and maximum filters. These filters are sampling invariant and allow shifts in the subpixel region

Published in:

Pattern Recognition, 1992. Vol.III. Conference C: Image, Speech and Signal Analysis, Proceedings., 11th IAPR International Conference on

Date of Conference:

30 Aug-3 Sep 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.