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Noise and sensitivity analysis for miniature E-field probes

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4 Author(s)
K. T. Ng ; Dept. of Electr. Eng., Virginia Univ., Charlottesville, VA, USA ; T. E. Batchman ; S. Pavlica ; D. L. Veasey

A complete noise analysis of a miniature field probe connected to an amplification system is presented. The analysis predicts a theoretical minimum detectable E-field of 2.8 V/m for the field probe. Frequency-domain noise measurements using a spectrum analyzer, on the other hand, give a minimum detectable E-field of 16.2 V/m. In addition, time-domain noise measurements, using a slotted line and a microwave, give a minimum detectable E-field of about 13 V/m. Considering the number of approximations made in the treatment and the amount of external noise present in the laboratory, the correlation of the theory to the measurement is considered adequate. The sensitivity of the probe output voltage with respect to the various parameters is analyzed

Published in:

IEEE Transactions on Instrumentation and Measurement  (Volume:38 ,  Issue: 1 )