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Metastability of CMOS master/slave flip-flops

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3 Author(s)
T. J. Gabara ; AT&T Bell Lab., Murray Hill, NJ, USA ; G. J. Cyr ; C. E. Stroud

Presents circuit techniques to improve the mean time between failures (MTBF) of a latch due to metastable events. The complete approach includes a unique design of the latch and the formation of series connected master/slave (M/S) flip-flops using this latch. An equation is developed to predict the MTBF due to metastability of a single latch and is extended to include single and multiple series connected M/S flip-flops. The equation predicts that the MTBF increases significantly by using such a M/S flip-flop configuration

Published in:

IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing  (Volume:39 ,  Issue: 10 )