Cart (Loading....) | Create Account
Close category search window
 

Test sets and reject rates: all fault coverages are not created equal

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Maxwell, P.C. ; Hewlett-Packard Co., Santa Clara, CA, USA ; Aitken, R.C.

The use of stuck-at-fault coverage for estimating overall quality levels is examined. Data from a part tested with both functional and scan tests are analyzed and compared with quality predictions generated by three existing theoretical models. It is shown that reasonable predictions are possible for functional tests, but that scan tests, due to misuse of theoretical equations, produce significantly worse quality levels than predicted.<>

Published in:

Design & Test of Computers, IEEE  (Volume:10 ,  Issue: 1 )

Date of Publication:

March 1993

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.