By Topic

X-ray energy separation method using a CdTe semiconductor X-ray imaging sensor and photon counting method

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$33 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

4 Author(s)
H. Tsutsui ; Matsushita Electric Ind. Co. Ltd., Osaka, Japan ; T. Ohtsuchi ; K. Ohmori ; S. Baba

A multichannel X-ray imaging sensor using a CdTe compound semiconductor radiation detector in photon counting mode was developed and tested for digital X-ray imaging and an X-ray energy separation capability. The X-ray imaging sensor was constructed of CdTe detector elements at a pitch of 0.25 mm. High band amplifiers, discriminators, and counters attached to each element formed the pulse counting circuit. Charge pulses generated by absorbed X-ray photons were directly counted and separated into two energy regions. Digitized X-ray images containing energy information were thus obtained. Using this sensor two separate X-ray images of different energy can be obtained simultaneously. A 256-channel X-ray imaging sensor was prepared and used to provide spatial resolution measurement for an X-ray charge. Low and high energy images of a hand phantom were thus obtained and both a soft tissue image and a bone image were produced using an energy subtraction method

Published in:

IEEE Transactions on Nuclear Science  (Volume:40 ,  Issue: 1 )