Cart (Loading....) | Create Account
Close category search window
 

Dynamic calibration of measurement channels using algorithms of nondifferentiable optimization

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Morawski, R.Z. ; Inst. of Radioelectron., Warsaw Univ. of Technol., Poland ; Podgorski, Andrzej ; Sutkowski, K.

The problem of dynamic calibration of measurement channels is considered under an assumption that the relationship between the measurand and the raw result of measurement is adequately modeled by a linear, fixed-parameter difference equation. The parameters of this model are estimated on the basis of the reference data using an algorithm of nondifferentiable optimization and criteria of the quality of calibration defined in the domain of the measurand. The results of calibration are evaluated using the errors of the results of reconstruction performed by means of the model resulting from calibration. Some conclusions on the metrological applicability of the proposed approach are formulated

Published in:

Instrumentation and Measurement, IEEE Transactions on  (Volume:41 ,  Issue: 6 )

Date of Publication:

Dec 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.