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A custom integrated circuit comparator for high-performance sampling applications

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3 Author(s)
Laug, O.B. ; Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA ; Souders, T.M. ; Flach, Donald R.

The authors report on the design and performance of an application-specific integrated circuit (ASIC) comparator that has been optimized for equivalent-time waveform sampling applications. The comparator, which has been fabricated with an 8.5 GHz fT , bipolar silicon process, features a bandwidth of >2 GHz, a settling-time accuracy of 0.1% in 2 ns, and almost total elimination of `thermal tails' in the settling response. Several novel design features that have been used to achieve this level of performance are presented. The comparator can be used in a sampling system for both frequency-domain measurements, e.g. wideband RMS voltage measurements, and high-accuracy time-domain pulse measurements

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Instrumentation and Measurement, IEEE Transactions on  (Volume:41 ,  Issue: 6 )