By Topic

Diagnostics integration-a TAC maintainer's view

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Stacey, T.R. ; Langley AFB, VA, USA ; Whaley, M.D.

The term integrated diagnostics is usually associated with built-in test (BIT). It is argued that from the TAC maintainer's view, integrating diagnostics is the total effort, beginning with fault reporting, troubleshooting, repair, and ending with modification to correct the physical cause of failure. It is pointed out that in order to understand where the user wants to go with diagnostic integration, it must be understood what the present situation is, what impact the integration will have, and what can be done to achieve the desired results

Published in:

Aerospace and Electronics Conference, 1988. NAECON 1988., Proceedings of the IEEE 1988 National

Date of Conference:

23-27 May 1988