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IEE Colloquium on `Design and Test of Mixed Analogue and Digital Circuits' (Digest No.154)

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The following topics were dealt with: test problems; logic analysers; A/D convertors; mixed-mode simulation; A1; fault diagnosis

Published in:
Design and Test of Mixed Analogue and Digital Circuits, IEE Colloquium on

Date of Conference: 15 Nov 1990

INSPEC Accession Number:
3811669
Conference Location :
London
Product Type:
Conference Publications

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