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Investigation of Bragg gratings on planar InGaAsP/InP waveguides at normal and oblique incidence

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3 Author(s)
G. Heise ; Siemens AG, Munich, West Germany ; R. Marz ; M. Schienle

The polarization-dependent mode coupling of Bragg gratings on planar InGaAsP/InP waveguides is investigated by transmittance and reflectance measurements at normal and oblique incidence in the 1.5- mu m wavelength region. Strong coupling between TE (transverse electric) and TM (transverse magnetic) modes is observed at oblique incident, whereas the TE-TE coupling vanishes at an incidence angle of 45 degrees . The behavior of the near field close to the Bragg wavelength and the effects of radiation into the substrate are analyzed. It is experimentally shown that small deformations of the phase fronts on the input side lead to strong interference effects on the output side.<>

Published in:

Journal of Lightwave Technology  (Volume:7 ,  Issue: 4 )