Cart (Loading....) | Create Account
Close category search window
 

Ultra-wide band, high-repetition rate single channel mobile diagnostic system

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Voss, D.E. ; Phillips Lab., Kirtland AFB, NM, USA ; Miner, L.M.

The problem of diagnosing transient electromagnetic signals with ultrawideband, multioctave spectra extending into the microwave region occurs in a number of areas, including lightning phenomena, electrostatic discharge testing, laser and pulsed-power research, and electronic effects testing. Although these phenomena can sometimes be diagnosed by standard single-shot means, they often occur at repetition rates in the kilohertz range and higher, and determining waveform time and frequency-domain shot-to-shot reproducibility is often of major importance to the researcher. A novel single-channel diagnostic system, the System Verification Apparatus (SVA), is described. It is capable of measuring 100-ps risetime signals on a single-shot basis, while simultaneously measuring pulse-to-pulse variation. The SVA is a fully integrated system which includes a broadband sensor, signal and trigger conditioning electronics, multiple parallel digitizers with deep local storage, a fiber-optic data link to the controlling computer, and automated software for accurately reconstructing, archiving, and analyzing waveforms.<>

Published in:

Microwave Symposium Digest, 1992., IEEE MTT-S International

Date of Conference:

1-5 June 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.