By Topic

An improved dielectric resonator method for surface impedance measurement of high-T/sub c/ superconductors

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Kobayashi, Y. ; Dept. of Electr. Eng., Saitama Univ., Japan ; Kayano, H.

An improved dielectric resonator method is proposed to measure the temperature characteristics of the surface impedance Z/sub s/ of superconductors automatically and with high resolution and good reproducibility. A perturbation formula for this resonator is derived to determine Z/sub s/ from measured values of resonant frequency and unloaded Q. Some measured results verified the usefulness of this method. A consideration of the effect of surface roughness was used to compare measured temperature dependence of the complex conductivity with the BCS model and three-fluid models.<>

Published in:

Microwave Symposium Digest, 1992., IEEE MTT-S International

Date of Conference:

1-5 June 1992