Referenced Items are not available for this document.
The finite element method is formulated in such a way that the electromagnetic solution of an excited cavity formed from an N-port waveguide junction leads directly and naturally to circuit characteristics of this junction. The use of edge elements eliminates nonphysical solutions. The reliability of the solution is assured compared to a penalty method. Accuracy of the method is demonstrated through the presentation of results for a waveguide T-junction while its efficiency is proven through the presentation of results for a case study of a finline step discontinuity.<
Published in:
Microwave Symposium Digest, 1992., IEEE MTT-S International
Date of Conference: 1-5 June 1992
- Page(s):
- 417 - 420 vol.1
- Meeting Date :
- 01 Jun 1992-05 Jun 1992
- ISSN :
- 0149-645X
- Print ISBN:
- 0-7803-0611-2
- INSPEC Accession Number:
- 4291787
- Conference Location :
- Albuquerque, NM, USA
- Digital Object Identifier :
- 10.1109/MWSYM.1992.188001
- Product Type:
- Conference Publications
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