Close category search window
 

Performance of fast frequency-hopped MFSK receivers with linear combining in a Rician fading channel with partial-band interference

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Robertson, R.C. ; Dept. of Electr. & Comput. Eng., US Naval Postgraduate Sch., Monterey, CA, USA ; Lee, K.Y.

An error probability analysis is performed for a conventional M-ary orthogonal frequency-shift keying (MFSK) noncoherent receiver employing fast frequency-hopped spread-spectrum waveforms transmitted over a Rician fading channel with partial-band interference. The partial-band interference is modeled as a Gaussian process. As might be expected, higher modulation orders and greater diversity improve overall system performance when only wideband interference is encountered. However, the performance of the conventional receiver is found to be significantly degraded by worst-case partial-band interference regardless of the modulation order or number of hops per data symbol used for all channel conditions

Published in:
Signals, Systems and Computers, 1991. 1991 Conference Record of the Twenty-Fifth Asilomar Conference on

Date of Conference: 4-6 Nov 1991

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.