Cart (Loading....) | Create Account
Close category search window

Testing of the high accuracy inertial navigation system in the Shuttle Avionics Integration Laboratory

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

2 Author(s)
Strachan, R.L. ; Rockwell Space Operations Co., Houston, TX, USA ; Evans, J.M.

The authors present a description, results, and interpretation of comparison testing between the high accuracy inertial navigation system (HAINS) and the KT-70 inertial measurement unit (IMU). The objective of the tests was to demonstrate that the HAINS can replace the KT-70 IMU in the Space Shuttle Orbiter, both singularly and totally. The most significant improvement of performance came in the tuned inertial/extended launch hold tests. The HAINS exceeded the 4-hour specification requirement. The performance of the HAINS demonstrated the transparency of operation with respect to the KT-70 IMU. In addition, an internally compensated INS is compatible with the Orbiter avionics and flight software

Published in:

Position Location and Navigation Symposium, 1992. Record. 500 Years After Columbus - Navigation Challenges of Tomorrow. IEEE PLANS '92., IEEE

Date of Conference:

23-27 Mar 1992

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.