Cart (Loading....) | Create Account
Close category search window
 

The influence of velocity-changing collisions on resonant degenerate four-wave mixing

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Richardson, W.H. ; Jet Propulsion Lab., California Inst. of Technol., Pasadena, CA, USA ; Malecki, L. ; Garmire, E.

The phase-conjugate signal observed in resonant degenerate four-wave mixing on the 6/sup 3/P/sub 2/ to 7/sup 3/S/sub 1/ transition of atomic mercury in a Hg-Ar discharge is investigated. At a fixed argon pressure the variation of the signal with pump powers is explained by a model that includes the effects of velocity-changing collisions (VCCs). As the argon pressure was varied from 0 to 1 torr an increase in the phase conjugate signal was observed and is ascribed to a change in the discharge dynamics with argon pressure and to the influence of VCCs. To further clarify the role of collisions and optical pumping, degenerate four-wave mixing spectra are examined as a function of pump power. Line shapes are briefly discussed.<>

Published in:

Quantum Electronics, IEEE Journal of  (Volume:25 ,  Issue: 3 )

Date of Publication:

March 1989

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.