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A method of test generation for large combinational circuits using input vector in pairs

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2 Author(s)
Liu Mingjian ; Guangdong Inst. of Technol., China ; Peng Jiehua

The authors investigate a new method of test generation for large combinational circuits using input vectors in pairs. The forming rules of the best test codes are derived and analysed. The cut theorem and cut test generation are studied. The experiment results are completely in accordance with the theory. This proves that the test generation approach given the paper is correct and useful

Published in:

Circuits and Systems, 1991. Conference Proceedings, China., 1991 International Conference on

Date of Conference:

16-17 Jun 1991