Cart (Loading....) | Create Account
Close category search window

Methods for information system project selection: an experimental study of AHP and SMART

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Yap, C.S. ; Dept. of Inf. Syst. & Comput. Sci., Nat. Univ. of Singapore, Singapore ; Raman, K.S. ; Leong, C.M.

Presents the findings of an experimental study of the perceived goodness of two multi-criteria methods for IS project selection: the analytic hierarchy process (AHP) and the simple multi-attribute rating technique (SMART). Student subjects were asked to solve either a simple or a complex problem, by either using any method (the control batches were not given training on AHP or SMART) or by using AHP or SMART. The task was to select one project from a number of proposed projects, given a set of scores for each proposed project on each of the selection criteria. The experimental results show that SMART is generally preferable to AHP, particularly for selection problems involving a large number of alternatives and selection criteria

Published in:

System Sciences, 1992. Proceedings of the Twenty-Fifth Hawaii International Conference on  (Volume:iii )

Date of Conference:

7-10 Jan 1992

Need Help?

IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2014 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.