Close category search window
 

Interconnect technologies and the thermal performance of MCM

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ozmat, B. ; Texas Instruments, Dallas, TX, USA

The thermal performances of multichip modules (MCMs) are compared on the basis of their interconnection technologies. The comparisons are made for hermetic and conduction cooled use environments. The thermal performances of the chip-first-type high density interconnect (HDI) technology, the flipped chip (FCP) technology, and the flipped tape automated bond (FTAB) technology are analyzed and compared for the MCM applications. The results show the thermal performance of each interconnect technology and the most effective ways of improving the performance of MCMs

Published in:
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on  (Volume:15 ,  Issue: 5 )

Date of Publication: Oct 1992

Need Help?


IEEE Advancing Technology for Humanity About IEEE Xplore | Contact | Help | Terms of Use | Nondiscrimination Policy | Site Map | Privacy & Opting Out of Cookies

A not-for-profit organization, IEEE is the world's largest professional association for the advancement of technology.
© Copyright 2013 IEEE - All rights reserved. Use of this web site signifies your agreement to the terms and conditions.