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Cellular automata based pattern generator for testing RAM

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3 Author(s)
Roy Chowdhury, D. ; Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India ; Sen Gupta, I. ; Pal Chaudhuri, P.

Presents a new strategy for parallel testing of RAM. A cellular automata (CA) based test pattern generator for detecting pattern sensitive faults (PSFs) in random access memories is also reported. An eight-cell one dimensional three neighbourhood CA has been extended to the five-neighbourhood case preserving the criterion of local connections. By changing the neighbourhood relation, all the 64 patterns for detecting the five-neighbourhood PSFs can be generated by loading two seeds only. The method can be easily extended for detecting PSFs of any neighbourhood.

Published in:

Computers and Digital Techniques, IEE Proceedings E  (Volume:139 ,  Issue: 6 )