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Single-layer antireflection coating of semiconductor lasers: polarization properties and the influence of the laser structure

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2 Author(s)
L. Atternas ; Ericsson Telecom, Stockholm, Sweden ; L. Thylen

Theoretical calculations of the modal reflectance of semiconductor laser facets, giving conditions for the coating index and thickness for a prescribed modal reflectance for TE and TM polarized light, are presented. A simplified method of calculating the modal reflectance is suggested and compared to a more exact method as well as to two other published methods. The possibilities of simultaneously achieving low reflectance for both polarizations are investigated with reference to the laser structure.<>

Published in:

Journal of Lightwave Technology  (Volume:7 ,  Issue: 2 )