By Topic

The canonical coordinates method for pattern deformation: theoretical and computational considerations

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

3 Author(s)
Segman, J. ; Technion-Israel Inst. of Technol., Haifa, Israel ; Rubinstein, J. ; Zeevi, Y.Y.

A method for the analysis of deformed patterns is presented and analyzed. The image is transformed into a new set of coordinates in which the deformation has a particular simple form. A number of deformations are considered. The practical implementation of the method is discussed. Similar aspects of biological vision are also considered

Published in:

Pattern Analysis and Machine Intelligence, IEEE Transactions on  (Volume:14 ,  Issue: 12 )