By Topic

A new efficient approach to VLSI yield improvement via yield/specification trade-offs

Sign In

Cookies must be enabled to login.After enabling cookies , please use refresh or reload or ctrl+f5 on the browser for the login options.

Formats Non-Member Member
$31 $13
Learn how you can qualify for the best price for this item!
Become an IEEE Member or Subscribe to
IEEE Xplore for exclusive pricing!
close button

puzzle piece

IEEE membership options for an individual and IEEE Xplore subscriptions for an organization offer the most affordable access to essential journal articles, conference papers, standards, eBooks, and eLearning courses.

Learn more about:

IEEE membership

IEEE Xplore subscriptions

1 Author(s)
Ilumoka, A.A. ; Dept. of Electr. Eng., Imperial Coll. of Sci. Technol. & Med., London

A method is described for making changes to specifications to optimize yield using information derived from a Monte Carlo analysis. Since nominal values and tolerances are fixed, only one Monte Carlo analysis is required for the entire optimization, i.e. the exploration of performance space is extremely inexpensive. In addition to yield/performance tradeoffs the method can be applied to (1) the definition of performance specifications (often a nontrivial task), and (2) to identification of redundant specifications and performance functions for testing

Published in:

Circuits and Systems, 1991., IEEE International Sympoisum on

Date of Conference:

11-14 Jun 1991